Description

Ondax’s patented1THz-Raman® Spectroscopy Systems extend the range of traditional Raman spectroscopy into the terahertz/low-frequency regime, exploring the same range of energy transitions as terahertz spectroscopy – without limiting the ability to measure the fingerprint region. This region reveals a new “Structural Fingerprint” to complement the traditional “Chemical Fingerprint” of Raman, enabling simultaneous analysis of both molecular structure and chemical composition in one instrument for advanced materials characterization. See What You’ve Been Missing – More Data, Better Sensitivity & Reliability Clear real-time differentiation of structural attributes of the material enables clear identification and analysis of polymorphs, raw material sources, defects & contamination, crystal formation, phase monitoring and synthesis methods. One Sample, One System, One Answer In-situ, real-time measurement of both composition and structural analysis eliminates the need for multiple samples and instruments, lowering capital, training and maintenance costs. For more information: Ondax Inc, 850 E Duarte Road, Monrovia, CA, - 626-357-9700, www.ondax.com