Description

The XR-100SDD is a thermoelectrically cooled solid-state silicon drift detector (SDD) and preamplifier. It is recommended for applications requiring the best energy resolution, very high count rates, and lowest X-ray energies. Its performance, small size, and low cost make it the ideal detector for many laboratory and OEM X-ray spectroscopy applications, including EDS and XRF. The XR-100SDD can provide a resolution of 125 eV FWHM at the Mn Kα line (electronic noise of 4.5 electrons rms), a peak to background of 20,000:1, an output count rate over 500 kcps, and can detect X-rays down to the Be Kα line (110 eV). It has a 25 mm2 active area and is 500 μm thick. The standard XR-100SDD has a 0.5 mil Be window for good efficiency above 2 keV. For lower energies, the optional C-Series windows provide good efficiency down to the C line. For count rates >500 kcps, the XR-100FastSDD is recommended. In the XR-100SDD, the detector is mounted on an extender (several different lengths are available), with the preamplifier in the attached metal box. It requires a separate signal processor and power supplies; Amptek’s PX5 is recommended and is ideally suited for most laboratory uses. The same SDD detectors are available in the smaller X-123SDD package or with smaller preamplifiers for OEMs and custom systems.